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Matching Tag: charge injection
Displaying 1 document
| Posted | Title | Category | Authors | Type | Privacy |
|---|---|---|---|---|---|
| 05/11/2012 | Impact of gate work-function on memory characteristics in Al2O3/HfOx/Al2O3/graphene charge-trap memory devices | Student/Faculty Work | Sejoon Lee, Emil B. Song, Sungmin Kim, David H. Seo, Sunae Seo, Tae Won Kang, and Kang L. Wang | faculty research, journal article | public |
